TOKYO–(BUSINESS WIRE)–JEOL Ltd. (TOKYO:6951) (President & CEO Izumi Oi) announces its launch of the FIB-SEM system �JIB-PS500i on February 1, 2023.
With the finer structure of advanced materials and advancing complexity of processes, evaluation techniques such as morphological observation and elemental analysis require higher resolution and precision. In the preparation of samples for transmission electron microscopes (TEM) in the semiconductor industry as well as in the battery and materials fields, “higher precision” and “thinner sample” are required.
This product is a combined system of the FIB (Focused Ion Beam) system that can process with high accuracy and the SEM (scanning electron microscope) of high resolution to satisfy these needs.
Main Features
Sales target
50 units/year
Product URL: https://www.jeol.com/products/scientific/fib/JIB-PS500i.php
JEOL Ltd.
3-1-2, Musashino, Akishima, Tokyo, 196-8558, Japan
Izumi Oi, President & CEO
(Stock code: 6951, Tokyo Stock Exchange Prime Market)
www.jeol.com
Contacts
JEOL Ltd.
Science and Measurement Instruments Sales Division
TEL: +81-3-6262-3567
https://www.jeol.com/contacts/products.php
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